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Consortium Description

The consortium is composed of 4 SME and two large company partners, and knowledge providers from universities and 2 public research centres. They have complementary competences in three different fields of instrumentation, in-line metrology, standardization and traceable measurements, and in two different application fields of thin-film technology. This diversity helps to significantly spread the impact of aim4np over many domains. Many of the participants from these partners had collaborated in the past in national, EU or other international projects, some of them with different affiliations at the time. This ensures that the consortium has enough congruence to enable the synergies needed for successfully completing the complex research tasks.

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CIN2 & CNM, CSIC

Centre d’Investigació en Nanociència
i Nanotecnologia. Centro Nacional de
Microelectrónica.
Bellaterra (Barcelona), Spain

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JR

JOANNEUM RESEARCH Forschungsgesellschaft mbH
Weiz, Austria

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SIOS Meßtechnik
Ilmenau, Germany

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Nanoworld Services GmbH
Erlangen, Germany

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logo-tu-wienTechnische Universität Wien
Wien, Austria

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Delft University of Technology
Faculty of 3mE – Department of PME
Mekelweg 2
Delft, The Netherlands

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Liestal, Switzerland

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IQS
 
 
Barcelona, Spain

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VSL
 
 
Delft, The Netherlands

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Nanotools GmbH
 
 
Munich, Germany

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FLUBETECH, S.L.
IPCT Ctra. N-150, Km 14,5

08227-Terrassa

Catalonia, Spain


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